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Yield modelling and defect tolerance in VLSI

Publication Data

Title Yield modelling and defect tolerance in VLSI
Contributors Will R. Moore, Wojciech Maly, Andrzej Strojwas
Publisher Hilger
Publication date 1988
Language English

Topics

England

Catalogue Data

OBNB ID GB8833521
ISBN 10 085274398X
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.38173

ISBD

P1053 [285]p.

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Yield modelling and defect tolerance in VLSI. ISBN 085274398X. Published by Hilger in 1988. Publication and catalogue information, links to buy online and reader comments.

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