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Developments in integrated circuit testing

Publication Data

Title Developments in integrated circuit testing
Contributor D. M. Miller
Publisher Academic Press
Publication date 1987
Publication location London
Language English

Topics

Integrated circuits :: Testing

Catalogue Data

OBNB ID GB8746994
ISBN 10 0124967353
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.38171

ISBD

P1053 x,440p.
P1042 Includes bibliography and index.

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Developments in integrated circuit testing. ISBN 0124967353. Published by Academic Press in 1987. Publication and catalogue information, links to buy online and reader comments.

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