Hot-carrier effects in MOS devices :: Eiji Takeda :: ISBN 0126822409 :: Academic Press 1995 :: OBNB, the Open British National Bibliography

Publication Data

Title Hot-carrier effects in MOS devices
Author Eiji Takeda
Contributors C. Y.-W. Yang, Akemi Miura-Hamada
Publisher Academic Press
Publication date 1995
Publication location San Diego
Language English

Descriptive Notes

Bibliography: p187-301. - Includes index.

Topics

Metal oxide semiconductors
011007176

Catalogue Data

OBNB ID GB9655100
ISBN 10 0126822409
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 537.6225

ISBD

P1053 xii,312p.
P1042 Includes bibliographical references (p. 187-301) and index.

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Hot-carrier effects in MOS devices by Eiji Takeda. ISBN 0126822409. Published by Academic Press in 1995. Publication and catalogue information, links to buy online and reader comments.