Power-constrained testing of VLSI circuits :: Nicola Nicolici :: ISBN 140207235X :: Kluwer Academic 2003 :: OBNB, the Open British National Bibliography

Publication Data

Title Power-constrained testing of VLSI circuits
Author Nicola Nicolici
Contributor Bashir Al-Hashimi
Publisher Kluwer Academic
Publication date 2003
Publication location Boston
Language English

Topics

Integrated circuits :: Very large scale integration :: Testing
Integrated circuits :: Very large scale integration :: Protection
Semiconductors :: Thermal properties

Catalogue Data

OBNB ID GBA323559
ISBN 10 140207235X
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.3950287

ISBD

P1053 xi, 178 p.
P1042 Includes bibliographical references and index.

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Power-constrained testing of VLSI circuits by Nicola Nicolici. ISBN 140207235X. Published by Kluwer Academic in 2003. Publication and catalogue information, links to buy online and reader comments.