A unified approach for timing verification and delay fault testing :: Mukund Sivaraman :: ISBN 0792380797 :: Kluwer Academic 1998 :: OBNB, the Open British National Bibliography

Publication Data

Title A unified approach for timing verification and delay fault testing
Author Mukund Sivaraman
Contributor Andrzej Strojwas
Publisher Kluwer Academic
Publication date 1998
Publication location Boston
Language English

Descriptive Notes

Includes index.

Topics

Digital integrated circuits :: Design and construction :: Data processing
Digital integrated circuits :: Testing
Electric fault location
011994372

Catalogue Data

OBNB ID GB9841036
ISBN 10 0792380797
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.3950287

ISBD

P1053 xv,155p.

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A unified approach for timing verification and delay fault testing by Mukund Sivaraman. ISBN 0792380797. Published by Kluwer Academic in 1998. Publication and catalogue information, links to buy online and reader comments.