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Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings

Publication Data

Title Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings
Contributors Dit-Yan Yeung, International Association for Pattern Recognition
Publisher Springer
Publication date 2006
Publication location Berlin
Language English

Topics

Pattern recognition systems :: Congresses

Catalogue Data

OBNB ID GBA677456
ISBN 10 3540372369
ISBN 13 9783540372363
Type BibliographicResource, Book
Dewey Classification 006.4

ISBD

P1053 xxi, 939 p.
P1042 Includes bibliographical references and index.

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Structural, syntactic, and statistical pattern recognition : joint IAPR international workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006 : proceedings. ISBN 9783540372363. Published by Springer in 2006. Publication and catalogue information, links to buy online and reader comments.