Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach :: ISBN 9780863417450 :: Institution of Engineering and Technology 2008 :: OBNB, the Open British National Bibliography

Publication Data

Title Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach
Contributors Yichuang Sun, Institution of Engineering and Technology
Publisher Institution of Engineering and Technology
Publication date 2008
Publication location London
Language English

Topics

Linear integrated circuits :: Testing
Mixed signal circuits :: Testing
Radio frequency integrated circuits :: Testing

Catalogue Data

OBNB ID GBA788513
ISBN 10 0863417450
ISBN 13 9780863417450
Type BibliographicResource, Book
Dewey Classification 621.38150287

ISBD

P1053 xx, 389 p.
P1042 Includes bibliographical references and index.

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Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach. ISBN 9780863417450. Published by Institution of Engineering and Technology in 2008. Publication and catalogue information, links to buy online and reader comments.