Analog IC reliability in nanometer CMOS :: Elie Maricau :: ISBN 9781461461623 :: Springer 2013 :: OBNB, the Open British National Bibliography

Publication Data

Title Analog IC reliability in nanometer CMOS
Author Elie Maricau
Contributor Georges Gielen
Publisher Springer
Publication date 2013
Publication location New York
Language English

Topics

Linear integrated circuits :: Reliability :: Computer simulation
Metal oxide semiconductors, Complementary
Nanoelectronics
Transistors :: Reliability :: Computer simulation

Catalogue Data

OBNB ID GBB342083
ISBN 10 1461461626
ISBN 13 9781461461623
Type BibliographicResource, Book
Dewey Classification 621.3815

ISBD

P1053 xvi, 198 pages
P1042 Includes bibliographical references and index.

Buy a copy

OBNB doesn't sell books, but you may be able to find a copy at one of these websites:

Analog IC reliability in nanometer CMOS by Elie Maricau. ISBN 9781461461623. Published by Springer in 2013. Publication and catalogue information, links to buy online and reader comments.