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Effect of refraction on the accuracy of measurements of the far infrared polarimeter system on JET (carbon wall)
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Effect of refraction on the accuracy of measurements of the far infrared polarimeter system on JET (carbon wall)

B. Bieg

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Publisher's no : EFDA-JET-PR(12)23.

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Effect of refraction on the accuracy of measurements of the far infrared polarimeter system on JET (carbon wall) by B. Bieg. Published by JET-EFDA in 2013. Publication and catalogue information, links to buy online and reader comments.

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