FinFET modeling for IC simulation and design : using the BSIM-CMG standard

Publication Data

• Title FinFET modeling for IC simulation and design : using the BSIM-CMG standard
• Author Yogesh Chauhan
• Contributors Darsen Duane Lu, Vanugopalan Sriramkumar, Sourabh Khandelwal, Juan Pablo Duarte, Navid Payvadosi, Ai Niknejad, Chenming Hu
• Publisher Academic Press
• Publication date 2015
• Publication location Amsterdam
• Language English

Contents

1. FinFET- from Device Concept to Standard Compact Model 2. Analog/RF behavior of FinFET 3. Core Model for FinFETs 4. Channel Current and Real Device Effects 5. Leakage Current Models 6. Charge, Capacitance and Nonquasi-Static Effect 7. Parasitic Resistances and Capacitances 8. Noise 9. Junction Diode Current and Capacitance 10. Benchmark Tests for Compact Models 11. BSIM-CMG Model Parameter Extraction 12. Temperature Effects

Topics

• Metal oxide semiconductor field-effect transistors
• Metal oxide semiconductor field-effect transistors :: Standards
• Three-dimensional integrated circuits
• 017050408

FinFET modeling for IC simulation and design : using the BSIM-CMG standard by Yogesh Chauhan. ISBN 9780124200852. Published by Academic Press in 2015. Publication and catalogue information, links to buy online and reader comments.