Progress and Development of Direct Detectors for Cryo-Electron Microscopy A. R. Faruqi, Richard Henderson, and Greg McMullan
Electron Optics and Electron Microscopy Conference Proceedings and Abstracts: A Supplement Peter W. Hawkes
Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the Nanoscale Grzegorz Wielgoszewski and Teodor Gotszalk
Topics
Optoelectronic devices
Optical data processing
Catalogue Data
OBNB ID GBB575303
ISBN 10 0128025905
ISBN 13 9780128025901
Type BibliographicResource, Book
Dewey Classification 621.367
ISBD
P1053 1 online resource.
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Advances in imaging and electron physics. ISBN 9780128025901. Published by Academic Press in 2015. Publication and catalogue information, links to buy online and reader comments.