Reprinted from: Microelectronic engineering, v.45/2-3.
Techniques and challenges for 300 mm silicon : processing, characterization, modelling and equipment : proceedings of Symposium F on Techniques and Challenges for 300mm Silicon of the E-MRS Spring Con. ISBN 0080436099. Published by Elsevier in 1999. Publication and catalogue information, links to buy online and reader comments.