Enlarge

Reliability and degradation : semiconductor devices and circuits

Publication Data

Title Reliability and degradation : semiconductor devices and circuits
Contributors M. J. Howes, D. V. Morgan
Publisher Wiley
Publication date 1981
Publication location Chichester
Language English

Descriptive Notes

Includes index.

Topics

Semiconductors :: Reliability

Catalogue Data

OBNB ID GB8133800
ISBN 10 0471280283
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.38152

ISBD

P1053 xii,444p.

Buy a copy

OBNB doesn't sell books, but you may be able to find a copy at one of these websites:

Reliability and degradation : semiconductor devices and circuits. ISBN 0471280283. Published by Wiley in 1981. Publication and catalogue information, links to buy online and reader comments.

obnb.uk is a Good Stuff website.