Hot-carrier reliability of MOS VLSI circuits :: Yusuf Leblebici :: ISBN 079239352X :: Kluwer Academic 1993 :: OBNB, the Open British National Bibliography

Publication Data

Title Hot-carrier reliability of MOS VLSI circuits
Author Yusuf Leblebici
Contributor Sung-Mo Kang
Publisher Kluwer Academic
Publication date 1993
Publication location Boston
Language English

Topics

Integrated circuits :: Very large scale integration :: Defects :: Mathematical models
Metal oxide semiconductors :: Reliability :: Mathematical models
009093163

Catalogue Data

OBNB ID GB9354819
ISBN 10 079239352X
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.395

ISBD

P1053 xvi,212p.

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Hot-carrier reliability of MOS VLSI circuits by Yusuf Leblebici. ISBN 079239352X. Published by Kluwer Academic in 1993. Publication and catalogue information, links to buy online and reader comments.