From contamination to defects, faults and yield loss : simulation and applications :: Jitendra B. Khare :: ISBN 0792397142 :: Kluwer Academic 1996 :: OBNB, the Open British National Bibliography

Publication Data

Title From contamination to defects, faults and yield loss : simulation and applications
Author Jitendra B. Khare
Contributor Wojciech Maly
Publisher Kluwer Academic
Publication date 1996
Publication location Boston
Language English

Descriptive Notes

Includes index.

Topics

Integrated circuits :: Very large scale integration :: Testing
Integrated circuits :: Very large scale integration :: Defects
Integrated circuits :: Very large scale integration :: Computer simulation
Computer-aided design

Catalogue Data

OBNB ID GB9642707
ISBN 10 0792397142
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.381548

ISBD

P1053 150p.

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From contamination to defects, faults and yield loss : simulation and applications by Jitendra B. Khare. ISBN 0792397142. Published by Kluwer Academic in 1996. Publication and catalogue information, links to buy online and reader comments.