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Applications of quantum entanglement to metrology

Publication Data

Title Applications of quantum entanglement to metrology
Contributors Stephen Nicholas Lea, National Physical Laboratory
Publisher National Physical Laboratory
Publication date 2005
Publication location Teddington
Language English

Descriptive Notes

Title from PDF title page (viewed on 8 Jan., 2007)

Topics

Quantum theory
Metrology

Catalogue Data

OBNB ID GBA701632
ISBN 10 n/a
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 530.12

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