System-on-chip test architectures : nanometer design for testability :: ISBN 9780123739735 :: Morgan Kaufmann 2008 :: OBNB, the Open British National Bibliography

Publication Data

Title System-on-chip test architectures : nanometer design for testability
Contributors Laung-Terng Wang, Charles E. Stroud, Nur A. Touba
Publisher Morgan Kaufmann
Publication date 2008
Publication location San Francisco, Calif.
Language English

Topics

Systems on a chip :: Testing
Integrated circuits :: Very large scale integration :: Testing
Integrated circuits :: Very large scale integration :: Design

Catalogue Data

OBNB ID GBA774758
ISBN 10 012373973X
ISBN 13 9780123739735
Type BibliographicResource, Book
Dewey Classification 621.395

ISBD

P1053 xxxvi, 856 p.
P1042 Includes bibliographical references and index.

Buy a copy

OBNB doesn't sell books, but you may be able to find a copy at one of these websites:

System-on-chip test architectures : nanometer design for testability. ISBN 9780123739735. Published by Morgan Kaufmann in 2008. Publication and catalogue information, links to buy online and reader comments.