XRF measurement of residual materials in electronics :: Martin Wickham :: National Physical Laboratory 2007 :: OBNB, the Open British National Bibliography

Publication Data

Title XRF measurement of residual materials in electronics
Author Martin Wickham
Contributors Christopher Hunt, National Physical Laboratory
Publisher National Physical Laboratory
Publication date 2007
Publication location Teddington
Language English

Descriptive Notes

Title from PDF title page (viewed on 15 Jan., 2008).

Topics

Electronic apparatus and appliances :: Testing
X-ray spectroscopy

Catalogue Data

OBNB ID GBA805962
ISBN 10 n/a
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.381548

ISBD

P1042 Includes bibliographical references.

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XRF measurement of residual materials in electronics by Martin Wickham. Published by National Physical Laboratory in 2007. Publication and catalogue information, links to buy online and reader comments.