On-wafer testing of PCB tracks as CPW lines as a production assessment method for anisotropic conductive film bonding :: National Physical Laboratory 2008 :: OBNB, the Open British National Bibliography

Publication Data

Title On-wafer testing of PCB tracks as CPW lines as a production assessment method for anisotropic conductive film bonding
Contributors M. Wickham, National Physical Laboratory
Publisher National Physical Laboratory
Publication date 2008
Publication location Teddington
Language English

Descriptive Notes

Title from PDF cover page (viewed on Aug. 27, 2008).

Topics

Printed circuits :: Design and construction
Electronics :: Materials
Thin films :: Electric properties
Anisotropy

Catalogue Data

OBNB ID GBA8A4192
ISBN 10 n/a
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.381531

ISBD

P1053 26 p.
P1042 Includes bibliographical references.

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On-wafer testing of PCB tracks as CPW lines as a production assessment method for anisotropic conductive film bonding. Published by National Physical Laboratory in 2008. Publication and catalogue information, links to buy online and reader comments.