Radiation damage in silicon / Gianluigi Casse
Radiation-tolerant CMOS single-photon imagers for multiradiation detection / Edoardo Charbon ... [et al.]
Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics / Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf
Novel total dose and heavy-ion charge collection phenomena in a new SiGe HBT on thin-film SOI technology / Grégory Avenier ... [et al.]
Radiation-hard voltage and current references in standard CMOS technologies / Vladimir Gromov and Anne-Johan Annema
Nanocrystal memories : an evolutionary approach to flash memory scaling and a class of radiation-tolerant devices / Cosimo Gerardi ... [et al.]
Radiation hardened by design SRAM strategies for TID and SEE mitigation / Lawrence T. Clark
A complete guide to multiple upsets in SRAMs processed in decananometric CMOS technologies / Gilles Gasiot and Phillippe Roche
Real-time soft error rate characterization of advanced SRAMs / Jean-Luc Autran ... [et al.]
Fault tolerance techniques and reliability modeling for SRAM-based FPGAs / Keith S. Morgan ... [et al.]
Assuring robust triple modular redundancy protected circuits in SRAM-based FPGAs / Michael Caffrey ... [et al.]
SEU/SET tolerant phase-locked loops / Robert L. Shuler, Jr.
Autonomous detection and characterization of radiation-induced transients in semiconductor integrated circuits / Balaji Narasimham ... [et al.]
Soft errors in digital circuits : overview and protection techniques for digital filters / Pedro reviriego Vasallo and Juan Antonio Maestro
Fault-injection techniques for dependability analysis : an overview / Massimo Violante.
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Radiation effects in semiconductors. ISBN 9781439826942. Published by CRC in 2011. Publication and catalogue information, links to buy online and reader comments.
