Delay fault testing for VLSI circuits :: Angela Krstić :: ISBN 0792382951 :: Kluwer Academic Publishers 1998 :: OBNB, the Open British National Bibliography

Publication Data

Title Delay fault testing for VLSI circuits
Author Angela Krstić
Contributor Kwang-Ting Cheng
Publisher Kluwer Academic Publishers
Publication date 1998
Publication location Boston
Language English

Topics

Integrated circuits :: Very large scale integration :: Testing
Delay faults (Semiconductors)

Catalogue Data

OBNB ID GB9900300
ISBN 10 0792382951
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.395

ISBD

P1053 xii, 191 p.
P1042 Includes bibliographical references (p173-188) and index.

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Delay fault testing for VLSI circuits by Angela Krstić. ISBN 0792382951. Published by Kluwer Academic Publishers in 1998. Publication and catalogue information, links to buy online and reader comments.