Integrated circuits :: Very large scale integration :: Computer-aided design
Integrated circuits :: Very large scale integration :: Testing
009093033
Catalogue Data
OBNB ID GB8947036
ISBN 10 0792390253
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.395
ISBD
P1053 xii,148p.
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Unified methods for VLSI simulation and test generation by Kwang-Ting Cheng. ISBN 0792390253. Published by Kluwer Academic in 1989. Publication and catalogue information, links to buy online and reader comments.