$High resolution X-ray diffractometry and topography$
Enlarge

High resolution X-ray diffractometry and topography

D. Keith Bowen

Publication Data

Title High resolution X-ray diffractometry and topography
Author D. Keith Bowen
Contributor B. K. Tanner
Publisher Taylor & Francis
Publication date 1998
Publication location London
Language English

Descriptive Notes

Includes index.

Topics

X-ray crystallography
X-rays :: Diffraction
009098364

Catalogue Data

OBNB ID GB9916486
ISBN 10 0850667585
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 548.83

ISBD

P1053 x,252p.
P1042 Includes bibliographical references and index.

Buy a copy

OBNB doesn't sell books, but you may be able to find a copy at one of these websites:

High resolution X-ray diffractometry and topography by D. Keith Bowen. ISBN 0850667585. Published by Taylor & Francis in 1998. Publication and catalogue information, links to buy online and reader comments.