D. Keith Bowen
3 published titles
Characterisation of crystal growth defects by X-ray methods
(Contributor)
1 edition
- ISBN: 0306406284
- Plenum published in cooperation with NATO Scientific Affairs Division
- 1980
- Details
High resolution X-ray diffractometry and topography
1 edition
- ISBN: 0850667585
- Taylor & Francis
- 1998
- Details
X-ray metrology in semiconductor manufacturing
1 edition
